<i>In situ</i> group delay dispersion measurements using the i²PIE ultrashort pulse reconstruction algorithm

We demonstrate in situ group delay dispersion (GDD) measurements of transparent dielectric materials using the i 2 PIE pulse measurement technique, with a precision comparable to white light interferometry and an order of magnitude better than multiphoton intrapulse interference phase scan (MIIPS). The GDD is obtained from the quadratic coefficient of a parabolic fit to the phase reconstructed with i 2 PIE, with a precision of ±5fs 2 . This method allows an in situ way to measure and compensate for the dispersion effects of additional optics in our setup directly at the sample plane, which is crucial when performing nonlinear optics experiments. We demonstrate a practical application of this by measuring and compensating for the dispersion caused by a phosphate-buffered saline solution, a buffer solution commonly used with biological samples in nonlinear microscopy.