Investigation of Analog Performance of Fin-Shaped AlGaN/GaN MOSHEMTs
We investigate the analog performance of Fin-shaped AlGaN/GaN MOSHEMTs and compare key analog parameters with those of conventional AlGaN/GaN MOSHEMTs, both having a channel length of 1 μm and a channel width of 80 nm. Using well-calibrated TCAD device simulator validated against experimental data with 100nm fin width and having a channel length of 2 μm. The proposed Fin-shaped AlGaN/GaN MOSHEMT exhibits notable enhancements in analog performance metrics, including a 50% increase in transconductance and a significant improvement in intrinsic voltage gain, compared to its conventional counterpart.
Authors
- Eknath Sarkar (ORCID: https://orcid.org/0000-0001-7541-2729)
- Abhijit Biswas (ORCID: https://orcid.org/0000-0002-5360-1817)
- Chandrima Mondal (ORCID: https://orcid.org/0000-0003-3806-1733)
- Sayani Ghosh (ORCID: https://orcid.org/0000-0001-5628-8769)
Institutions
- University of Calcutta (IN)
- Jadavpur University (IN)
- Haldia Institute of Technology (IN)
Publication Details
- Published
- 2025-06-18
- DOI
- https://doi.org/10.1109/gcon65540.2025.11173369
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00