Correlative electron and X-ray microscopy: a new lens for sodium-ion battery research
Abstract Sodium-ion batteries (SIBs) are emerging as a promising alternative to lithium-ion technology, with the first commercial cells now available. Understanding their structure and degradation mechanisms is crucial for further development. This study presents a correlative approach combining X-ray and electron microscopy to achieve multi-scale imaging of SIB materials. X-ray microscopy enables non-destructive 3D analysis of electrode architecture, while electron microscopy provides high-resolution insights into particle morphology, interfaces, and failure modes. By integrating these techniques, we establish a comprehensive workflow for analyzing structural and chemical changes. Our results offer one of the first in-depth imaging and analysis of commercial SIB materials and provide valuable feedback for material optimization. This correlative methodology sets a new standard for battery research, advancing the development of next-generation sodium-ion energy storage solutions.
Authors
- Adrian Mikitisin (ORCID: https://orcid.org/0000-0002-4789-2144)
- Heinrich Ditler (ORCID: https://orcid.org/0000-0002-4320-6207)
- Moritz Schütte (ORCID: https://orcid.org/0009-0000-8781-2172)
Institutions
- RWTH Aachen University (DE)
Publication Details
- Journal
- Methods in microscopy
- Published
- 2025-09-25
- DOI
- https://doi.org/10.1515/mim-2025-0008
- Primary Topic
- Advancements in Battery Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00