Application of graph techniques, heuristic methods, and obstacle clearance design in airport elevations optimization for airport design
Airports’ layout elevations optimization has always been a critical topic in airport construction; especially for airports near mountainous areas. Earthwork from these airport construction projects related to obstacle area removal can significantly impact the environment and lead to mounting costs during the construction phase. To address this issue, we developed a graph-based method to parse airport layouts into mathematical model based on graphs, enabling the determination of boundaries and flow calculations prior to conducting elevation optimizations. The graph representation also allows for clearer integration of spatial relationships and dependencies in the design process and make it mathematically manageable during optimization process. We also developed obstacles clearance design system based on a BIM platform by decoupling airport layout, key elevations, and obstacle-free zones, which enable flexibility in the configuration of elevations and integrated obstacle free zone surfaces on airport runways. Using a heuristic method, amplitude of elevations or slope changes were treated as variables, and with certain methods we could get elevations at intersections or runway ends. Through this integrated methodology, we were able to determine the optimized elevations with minimal earthwork, this approach also minimizes environmental impact and significantly reduces project costs.
Authors
- Zhixin Zhao (ORCID: https://orcid.org/0000-0002-8915-4924)
- Zhengsheng Han (ORCID: https://orcid.org/0000-0003-2087-0356)
- Feilong Li (ORCID: https://orcid.org/0000-0002-9194-1871)
- Kai Bao (ORCID: https://orcid.org/0000-0003-2033-0907)
- Mengsheng Cui
Institutions
- Civil Aviation Administration of China (CN)
Publication Details
- Published
- 2025-09-25
- DOI
- https://doi.org/10.1117/12.3076675
- Primary Topic
- Air Traffic Management and Optimization
- Type
- article
- Field-Weighted Citation Impact
- 0.00