Comprehensive Computational Simulations of ESD Analysis for Complex Devices

The evolution of electronic design, driven by demand for innovation across various sectors, introduces challenges in mitigating electrostatic discharge (ESD) risks. Miniaturization and high-density integration amplify these risks, which are compounded by nonlinear plasma channels from non-contact ESD, demanding proactive and reactive measures for prevention and mitigation. Computational modeling offers essential insights and enables seamless integration of full-wave models with circuits, providing efficient solutions through finite element adaptive mesh refinement in frequency and time domains. Through this paper in this conference, we will focus on ESD analysis and mitigation strategies for contact and non-contact air discharge events, aiming to enhance the reliability of modern electronic systems.