Integrated Circuit Radiation Source Reconstruction Method Based on Deep Neural Network

Conventional electromagnetic radiation analysis techniques struggle to accurately predict radiation sources in the increasingly complex electromagnetic environment. This paper proposes a novel electromagnetic radiation source reconstruction method based on deep neural network (DNN). This method maps near-field data to electromagnetic dipoles and can automatically adjusts parameters to accommodate near-field data with different structures. It effectively addresses the ill-conditioned matrix issue inherent in traditional approaches and eliminates the need for specific initial values, unlike other algorithms. Simulation results show that the proposed method precisely reconstructs the radiation source characteristics of complex systems in RF and microwave circuits, offering valuable insights and practical tools for electromagnetic compatibility (EMC) design in integrated circuits.

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Publication Details

Published
2025-08-04
DOI
https://doi.org/10.1109/iwem65640.2025.11168053
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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Integrated Circuit Radiation Source Reconstruction Method Based on Deep Neural Network

Yuanan Liu, Yongle Wu, Qin Jie, Qingyao Zeng et al.
Integrated Circuits and Semiconductor Failure Analysis
article

Integrated Circuit Radiation Source Reconstruction Method Based on Deep Neural Network

Yuanan Liu, Yongle Wu, Qin Jie, Qingyao Zeng, Weimin Wang
article en

Abstract

Conventional electromagnetic radiation analysis techniques struggle to accurately predict radiation sources in the increasingly complex electromagnetic environment. This paper proposes a novel electromagnetic radiation source reconstruction method based on deep neural network (DNN). This method maps near-field data to electromagnetic dipoles and can automatically adjusts parameters to accommodate near-field data with different structures. It effectively addresses the ill-conditioned matrix issue inherent in traditional approaches and eliminates the need for specific initial values, unlike other algorithms. Simulation results show that the proposed method precisely reconstructs the radiation source characteristics of complex systems in RF and microwave circuits, offering valuable insights and practical tools for electromagnetic compatibility (EMC) design in integrated circuits.

Beijing University of Posts and Telecommunications (CN), China Mobile (China) (CN), Xiaomi (China) (CN)
Openalex Percentile: Top 74%
Integrated Circuits and Semiconductor Failure Analysis
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Integrated Circuit Radiation Source Reconstruction Method Based on Deep Neural Network — Yuanan Liu, Yongle Wu, et al. · (2025) | TGRS Research Map | TGRS