Frequency Domain-Based Signal Integrity Evaluation Metrics for High-Density Interconnection (HDI) Systems
In this paper, we propose frequency domain-based signal integrity (SI) evaluation metrics for high-density interconnection systems. The proposed approach introduces two key metrics: eye aperture metric <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$A_{m}$</tex> and overshoot metric <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$O_{m}$</tex>, derived from the voltage transfer function in the frequency domain. These metrics enable fast and efficient SI performance evaluation across various channel environments in HDI systems. Compared to conventional eye diagram simulation, the proposed metrics accurately capture the relative SI performance trends across channels while significantly reducing computation time.
Authors
- Seunghun Ryu (ORCID: https://orcid.org/0000-0002-7967-9436)
- Seonghi Lee (ORCID: https://orcid.org/0000-0003-4829-2551)
- Seungyoung Ahn (ORCID: https://orcid.org/0000-0002-0771-7050)
- Changmin Lee (ORCID: https://orcid.org/0000-0002-3203-0445)
- Sanguk Lee (ORCID: https://orcid.org/0000-0002-9612-7801)
- Dongryul Park (ORCID: https://orcid.org/0000-0001-9846-7634)
- Hyun‐Woo Kim (ORCID: https://orcid.org/0000-0003-3764-1648)
- Dongkyun Kim (ORCID: https://orcid.org/0000-0002-1995-378X)
- Jinwook Lee (ORCID: https://orcid.org/0000-0002-4426-8880)
- Jongwook Kim (ORCID: https://orcid.org/0000-0002-0379-6521)
Institutions
- SK Group (South Korea) (KR)
- Korea Advanced Institute of Science and Technology (KR)
Publication Details
- Published
- 2025-08-18
- DOI
- https://doi.org/10.1109/emcsipi52291.2025.11170183
- Primary Topic
- 3D IC and TSV technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00