Frequency Domain-Based Signal Integrity Evaluation Metrics for High-Density Interconnection (HDI) Systems

In this paper, we propose frequency domain-based signal integrity (SI) evaluation metrics for high-density interconnection systems. The proposed approach introduces two key metrics: eye aperture metric <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$A_{m}$</tex> and overshoot metric <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$O_{m}$</tex>, derived from the voltage transfer function in the frequency domain. These metrics enable fast and efficient SI performance evaluation across various channel environments in HDI systems. Compared to conventional eye diagram simulation, the proposed metrics accurately capture the relative SI performance trends across channels while significantly reducing computation time.

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Published
2025-08-18
DOI
https://doi.org/10.1109/emcsipi52291.2025.11170183
Primary Topic
3D IC and TSV technologies
Type
article
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article

Frequency Domain-Based Signal Integrity Evaluation Metrics for High-Density Interconnection (HDI) Systems

Seunghun Ryu, Seonghi Lee, Seungyoung Ahn, Changmin Lee et al.
3D IC and TSV technologies
article

Frequency Domain-Based Signal Integrity Evaluation Metrics for High-Density Interconnection (HDI) Systems

Seunghun Ryu, Seonghi Lee, Seungyoung Ahn, Changmin Lee, Sanguk Lee, Dongryul Park, Hyun‐Woo Kim, Dongkyun Kim, Jinwook Lee, Jongwook Kim
article en

Abstract

In this paper, we propose frequency domain-based signal integrity (SI) evaluation metrics for high-density interconnection systems. The proposed approach introduces two key metrics: eye aperture metric <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$A_{m}$</tex> and overshoot metric <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$O_{m}$</tex>, derived from the voltage transfer function in the frequency domain. These metrics enable fast and efficient SI performance evaluation across various channel environments in HDI systems. Compared to conventional eye diagram simulation, the proposed metrics accurately capture the relative SI performance trends across channels while significantly reducing computation time.

SK Group (South Korea) (KR), Korea Advanced Institute of Science and Technology (KR)
Openalex Percentile: Top 74%
3D IC and TSV technologies
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Frequency Domain-Based Signal Integrity Evaluation Metrics for High-Density Interconnection (HDI) Systems — Seunghun Ryu, Seonghi Lee, et al. · (2025) | TGRS Research Map | TGRS