Simulation and Analysis of Intentional EMI Attack Against Power Delivery Network of Ring Oscillator Based True Random Number Generator

This article presents a simulation and analysis of an intentional electromagnetic interference (IEMI) attack targeting the power delivery network (PDN) of a ring-oscillator (RO)-based true random number generator (TRNG). The jitter of ROs is a source of randomness, and the randomness is key for maintaining the hardware security of the device. When the jitter is reduced due to the injected noise, the randomness of the TRNG is degraded. In this article, the simulation setup of IEMI attack is proposed. When the noise associated with IEMI injection to the PDN is delivered to the ROs and the locking occurs, the output response of the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{R O}$</tex> is affected. This phenomenon is simulated and validated via measurement. Also, the simulated outputs of the TRNG are evaluated. The proposed simulation is capable of predicting the randomness degradation under the IEMI attack.

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Publication Details

Published
2025-08-18
DOI
https://doi.org/10.1109/emcsipi52291.2025.11170246
Primary Topic
Chaos-based Image/Signal Encryption
Type
article
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article

Simulation and Analysis of Intentional EMI Attack Against Power Delivery Network of Ring Oscillator Based True Random Number Generator

Daisuke Fujimoto, Changhoon Lee, Youngwoo Kim, Yuichi Hayashi
Chaos-based Image/Signal Encryption
article

Simulation and Analysis of Intentional EMI Attack Against Power Delivery Network of Ring Oscillator Based True Random Number Generator

Daisuke Fujimoto, Changhoon Lee, Youngwoo Kim, Yuichi Hayashi
article en

Abstract

This article presents a simulation and analysis of an intentional electromagnetic interference (IEMI) attack targeting the power delivery network (PDN) of a ring-oscillator (RO)-based true random number generator (TRNG). The jitter of ROs is a source of randomness, and the randomness is key for maintaining the hardware security of the device. When the jitter is reduced due to the injected noise, the randomness of the TRNG is degraded. In this article, the simulation setup of IEMI attack is proposed. When the noise associated with IEMI injection to the PDN is delivered to the ROs and the locking occurs, the output response of the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathbf{R O}$</tex> is affected. This phenomenon is simulated and validated via measurement. Also, the simulated outputs of the TRNG are evaluated. The proposed simulation is capable of predicting the randomness degradation under the IEMI attack.

Sejong University (KR), Seoul Semiconductor (South Korea) (KR), Nara Institute of Science and Technology (JP), Korea Institute of Science & Technology Information (KR)
Openalex Percentile: Top 74%
Chaos-based Image/Signal Encryption
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