Characterization of Terahertz Materials Based on Ripple Transmission Lines

The paper addresses the need for extracting characteristic parameters of materials in the terahertz frequency band by designing a terahertz contact-based measurement system based on ripple transmission lines. It also discusses the extraction method for contact-based characteristic parameters in free space. Silicon wafers and water were used for testing, and a numerical iterative method was employed to extract the material’s characteristic parameters. The test results show that the characteristic parameters obtained using the contact-based measurement system align with typical values, further validating the effectiveness of the proposed method.