FLITSR: Improved Spectrum-Based Localization of Multiple Faults by Iterative Test Suite Reduction – RCR Report
This report details the contents of the artifact for the paper “FLITSR: Improved Spectrum-Based Localization of Multiple Faults by Iterative Test Suite Reduction”, as well as detailed instructions for its installation and usage. The artifact contains all the necessary components to replicate the results of the study, including the three datasets used as well as the FLITSR tool which is used as both the implementation of the FLITSR algorithm and the evaluation framework for the experiments in the study.
Authors
- Bernd Fischer (ORCID: https://orcid.org/0000-0002-1815-218X)
- Dylan Callaghan (ORCID: https://orcid.org/0000-0003-4965-2643)
Institutions
- Stellenbosch University (ZA)
Publication Details
- Journal
- ACM Transactions on Software Engineering and Methodology
- Published
- 2025-09-24
- DOI
- https://doi.org/10.1145/3768631
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00