Characterization of diffraction efficiency for X-ray analyzer crystals using a laboratory-based primary diffraction photon method

X-ray analyzer crystals are core components in monochromatic X-ray sources. Their diffraction efficiency (<i>η</i>) critically determines key beam parameters like flux density. Current efficiency measurements primarily rely on synchrotron sources, facing challenges of limited access and high cost. We present a laboratory method using primary diffraction photons to eliminate systematic errors from detector resolution limitations. Based on this principle, a calibration system achieved 22.2<i>%</i>±2.5<i>%</i> peak <i>η</i> for Si(220) at 4.51 keV. This approach and system provide reliable support for calibrating the diffraction efficiency of various analyzer crystals and can be deployed for rapid screening of crystals in X-ray calibration facilities.