Direct Measurement of Thermal Conductivity via Time-Resolved Thermal-Radiation Spectroscopy

We developed a novel technique – time-resolved thermal-radiation spectroscopy – to directly measure thermal conductivity in bulk and thin-film optical materials. We experimentally demonstrated its application on a 3 mm-thick fused-silica window.

Authors

Yuzhe Xiao (ORCID: https://orcid.org/0000-0002-0971-2480)
Dmitrii Shymkiv

Institutions

University of North Texas (US)

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.1364/cleo_si.2025.ss141_3
Primary Topic: Thermal properties of materials
Type: article
Field-Weighted Citation Impact: 0.00

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article

Direct Measurement of Thermal Conductivity via Time-Resolved Thermal-Radiation Spectroscopy

Yuzhe Xiao, Dmitrii Shymkiv

Jan 1, 2025

Thermal properties of materials

article

Direct Measurement of Thermal Conductivity via Time-Resolved Thermal-Radiation Spectroscopy

Yuzhe Xiao, Dmitrii Shymkiv

January 1, 2025article en

Abstract

University of North Texas (US)

Openalex Percentile: Top 80%

Thermal properties of materials

DOI Source OpenAlex

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Direct Measurement of Thermal Conductivity via Time-Resolved Thermal-Radiation Spectroscopy — Yuzhe Xiao, Dmitrii Shymkiv · (2025) | TGRS Research Map | TGRS