Nanoscale Measurement and Manipulation of Exciton Species in Monolayer Semiconductors

We use cryogenic cathodoluminescence microscopy with in-situ gating and e-beam patterning to probe the effects of nanoscale variations in strain, doping, and defects on exciton species in hBN-encapsulated WSe 2 .

Authors

Benjamin J. Lawrie (ORCID: https://orcid.org/0000-0003-1431-066X)
Bogdan Dryzhakov (ORCID: https://orcid.org/0000-0002-2156-4396)
YC Wu
Gabriel Cowley

Institutions

Oak Ridge National Laboratory (US)

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.1364/cleo_si.2025.ss141_6
Primary Topic: 2D Materials and Applications
Type: article
Field-Weighted Citation Impact: 0.00

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article

Nanoscale Measurement and Manipulation of Exciton Species in Monolayer Semiconductors

Benjamin J. Lawrie, Bogdan Dryzhakov, YC Wu, Gabriel Cowley

Jan 1, 2025

2D Materials and Applications

article

Nanoscale Measurement and Manipulation of Exciton Species in Monolayer Semiconductors

Benjamin J. Lawrie, Bogdan Dryzhakov, YC Wu, Gabriel Cowley

January 1, 2025article en

Abstract

Oak Ridge National Laboratory (US)

Openalex Percentile: Top 80%

2D Materials and Applications

DOI Source OpenAlex

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Nanoscale Measurement and Manipulation of Exciton Species in Monolayer Semiconductors — Benjamin J. Lawrie, Bogdan Dryzhakov, et al. · (2025) | TGRS Research Map | TGRS