A New Wideband Dual-Component Magnetic Probe for the Near-Field Scanning Measurement

In this work, we introduce a new wideband magnetic probe characterized by the dual-component measurement. The hybrid-loop detection structure of the proposed probe consists of a pair of L-shaped monopoles, a grounded line, and an interconnected line. The proposed probe is manufactured on a four-layer printed circuit board (PCB) with a 0.4-mm-thick RO4350B substrate and two 0.2-mm-thick RO4450F substrates. In order to simultaneously measure two orthogonal magnetic-field components (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>y</sub></i> and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>z</sub></i>), the L-shaped monopoles are mirrored symmetrically and printed on the layers L2 and L3, and the grounded and interconnected lines are etched on the layers L2 and L3, respectively. In addition, for the purpose of preventing undesired magnetic-field coupling, the ground planes adjacent to the detection loops are fully metallized and have no metal slot. Finally, the manufactured probe is simulated, tested, and characterized by the standard near-field scanning system. The experimental results demonstrate that the proposed wideband magnetic probe not only can simultaneously test two orthogonal magnetic-field components (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>y</sub></i> and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>z</sub></i>) but also has a wider operational bandwidth (4.5∼15 GHz).

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Publication Details

Journal
IEEE Sensors Letters
Published
2025-09-24
DOI
https://doi.org/10.1109/lsens.2025.3613325
Citations
2
Primary Topic
Electromagnetic Compatibility and Measurements
Type
article
Field-Weighted Citation Impact
1.46
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article

A New Wideband Dual-Component Magnetic Probe for the Near-Field Scanning Measurement

Chengyang Luo, Quan Huang, Lei Wang, Jianke Li
2 citations
IEEE Sensors Letters
Electromagnetic Compatibility and Measurements
1.46
article

A New Wideband Dual-Component Magnetic Probe for the Near-Field Scanning Measurement

Chengyang Luo, Quan Huang, Lei Wang, Jianke Li
article en
2 citations

Abstract

In this work, we introduce a new wideband magnetic probe characterized by the dual-component measurement. The hybrid-loop detection structure of the proposed probe consists of a pair of L-shaped monopoles, a grounded line, and an interconnected line. The proposed probe is manufactured on a four-layer printed circuit board (PCB) with a 0.4-mm-thick RO4350B substrate and two 0.2-mm-thick RO4450F substrates. In order to simultaneously measure two orthogonal magnetic-field components (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>y</sub></i> and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>z</sub></i>), the L-shaped monopoles are mirrored symmetrically and printed on the layers L2 and L3, and the grounded and interconnected lines are etched on the layers L2 and L3, respectively. In addition, for the purpose of preventing undesired magnetic-field coupling, the ground planes adjacent to the detection loops are fully metallized and have no metal slot. Finally, the manufactured probe is simulated, tested, and characterized by the standard near-field scanning system. The experimental results demonstrate that the proposed wideband magnetic probe not only can simultaneously test two orthogonal magnetic-field components (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>y</sub></i> and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H<sub>z</sub></i>) but also has a wider operational bandwidth (4.5∼15 GHz).

IEEE Sensors LettersVol. 9(11)
China Electronic Product Reliability and Environmental Test Institute (CN)
Openalex Percentile: Top 15%
Electromagnetic Compatibility and Measurements
1.46
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