Forecasting Wafer Fab Outputs using Lot Remaining Cycle Time Prediction in Semiconductor Manufacturing

Semiconductor manufacturing is a crucial component of modern supply chains, yet it faces significant challenges due to the complexity and variability of production processes. This study addresses the problem of forecasting wafer fab outputs by predicting the remaining cycle time of lots in semi-conductor manufacturing. We propose a statistical modeling approach that leverages historical data to estimate lot departures and output quantities for a given forecasting horizon. The study focuses on the 20 most highest-volume products in a high-mix, low-volume production environment, using data from a major wafer fab in southeast France. A total of 26 linear regression models are evaluated, considering different contexts input and output variables, to predict RCTs and forecast lot departures. The results indicate that the best-performing model achieves a forecasting accuracy of 41.55% for an 8-week forecasting horizon and 33.39% for a 12-week forecasting horizon, comparable to what is found in the literature. However, the study also highlights the challenges of extrapolating training data to future periods, particularly due to variability in product prioritization and system congestion. Future work will focus on integrating additional variables, such as congestion metrics and due dates, as well as exploring non-linear models to enhance forecasting accuracy and robustness. This research provides a foundational framework for wafer fab output forecasting, essential for effective production management and supply chain stability in the semiconductor industry.

Authors

Institutions

Publication Details

Published
2025-08-17
DOI
https://doi.org/10.1109/case58245.2025.11164128
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Forecasting Wafer Fab Outputs using Lot Remaining Cycle Time Prediction in Semiconductor Manufacturing

Adrien Wartelle, Stéphane Dauzère‐Pérès, Quentin Christ, Claude Yugma et al.
Industrial Vision Systems and Defect Detection
article

Forecasting Wafer Fab Outputs using Lot Remaining Cycle Time Prediction in Semiconductor Manufacturing

Adrien Wartelle, Stéphane Dauzère‐Pérès, Quentin Christ, Claude Yugma, Renaud Roussel
article en

Abstract

Semiconductor manufacturing is a crucial component of modern supply chains, yet it faces significant challenges due to the complexity and variability of production processes. This study addresses the problem of forecasting wafer fab outputs by predicting the remaining cycle time of lots in semi-conductor manufacturing. We propose a statistical modeling approach that leverages historical data to estimate lot departures and output quantities for a given forecasting horizon. The study focuses on the 20 most highest-volume products in a high-mix, low-volume production environment, using data from a major wafer fab in southeast France. A total of 26 linear regression models are evaluated, considering different contexts input and output variables, to predict RCTs and forecast lot departures. The results indicate that the best-performing model achieves a forecasting accuracy of 41.55% for an 8-week forecasting horizon and 33.39% for a 12-week forecasting horizon, comparable to what is found in the literature. However, the study also highlights the challenges of extrapolating training data to future periods, particularly due to variability in product prioritization and system congestion. Future work will focus on integrating additional variables, such as congestion metrics and due dates, as well as exploring non-linear models to enhance forecasting accuracy and robustness. This research provides a foundational framework for wafer fab output forecasting, essential for effective production management and supply chain stability in the semiconductor industry.

Centre National de la Recherche Scientifique (FR), Mines Saint-Étienne (FR), STMicroelectronics (India) (IN)
Openalex Percentile: Top 64%
Industrial Vision Systems and Defect Detection
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.