The instability of gas-filled electronic components in the presence of gamma radiation

The investigations present experimental results dealing with the low doses of gamma radiation impact to breakdown voltage of gas-filled electronic components. It was shown that dynamic breakdown voltage is statistical property which experimental results can be described using Weibull’s probability distribution function, in the case when components were not subjected to ionizing radiation. The results have also shown that breakdown voltage is very sensitive to gamma radiation even for such a low doses, slightly higher than natural radioactivity. The paper also present the study dealing with possibility for application of gas-filled components as low doses gamma radiation sensors. In this case, mean value of breakdown voltage was used as dosimetric parameter.