Digital Twins in Reliability Engineering: Innovations, Challenges and Opportunities
An analysis of **digital twins** in reliability engineering, covering their multidisciplinary foundations, applications, and challenges in industries like aerospace and manufacturing.
Authors
- David Han (ORCID: https://orcid.org/0000-0001-6437-3007)
- James Brownlow
Institutions
- Edwards Air Force Base (US)
- The University of Texas at San Antonio (US)
Publication Details
- Journal
- The ITEA Journal of Test and Evaluation
- Published
- 2025-09-22
- DOI
- https://doi.org/10.61278/itea.46.3.1005
- Citations
- 1
- Primary Topic
- Reliability and Maintenance Optimization
- Type
- article
- Field-Weighted Citation Impact
- 1.30