CHC-DETR: An End-to-End Efficient Defect Detection Network

To improve the performance of defect detection for electric power fittings while maintaining detection efficiency, this paper proposes an innovative end-to-end defect detection model named CHC-DETR. First, the ConvNeXtv2 architecture is adopted as the backbone network, integrating GRN to optimize the model’s generalization capacity and stability. Second, a HiLo-Aware Feature Interaction module (HAFI) is designed to enhance computational efficiency and multi-scale feature extraction by separating high-frequency and low-frequency information processing. Finally, a CSP-Refined Wavelet Convolution Module (CWCM) is introduced to strengthen the encoder’s ability to extract complex defect features and leverage wavelet transform to enhance low-frequency features, improving the recognition of tiny or irregular defects. On the self-constructed CU-DET dataset, the proposed model reaches a mAP of 94.9% and an FPS of 56.8. Experimental results reveal that the proposed algorithm provides an productive and high-performance solution for industrial defect detection.

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Publication Details

Published
2025-06-20
DOI
https://doi.org/10.1109/isaeece66033.2025.11160252
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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article

CHC-DETR: An End-to-End Efficient Defect Detection Network

Zihan Hu, Zhiguo Fan, Jun Hu, Chuanlin Zhang et al.
Integrated Circuits and Semiconductor Failure Analysis
article

CHC-DETR: An End-to-End Efficient Defect Detection Network

Zihan Hu, Zhiguo Fan, Jun Hu, Chuanlin Zhang, Jinze Li, Long Jin
article en

Abstract

To improve the performance of defect detection for electric power fittings while maintaining detection efficiency, this paper proposes an innovative end-to-end defect detection model named CHC-DETR. First, the ConvNeXtv2 architecture is adopted as the backbone network, integrating GRN to optimize the model’s generalization capacity and stability. Second, a HiLo-Aware Feature Interaction module (HAFI) is designed to enhance computational efficiency and multi-scale feature extraction by separating high-frequency and low-frequency information processing. Finally, a CSP-Refined Wavelet Convolution Module (CWCM) is introduced to strengthen the encoder’s ability to extract complex defect features and leverage wavelet transform to enhance low-frequency features, improving the recognition of tiny or irregular defects. On the self-constructed CU-DET dataset, the proposed model reaches a mAP of 94.9% and an FPS of 56.8. Experimental results reveal that the proposed algorithm provides an productive and high-performance solution for industrial defect detection.

Shanghai University of Electric Power (CN)
Openalex Percentile: Top 75%
Integrated Circuits and Semiconductor Failure Analysis
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CHC-DETR: An End-to-End Efficient Defect Detection Network — Zihan Hu, Zhiguo Fan, et al. · (2025) | TGRS Research Map | TGRS