CHC-DETR: An End-to-End Efficient Defect Detection Network
To improve the performance of defect detection for electric power fittings while maintaining detection efficiency, this paper proposes an innovative end-to-end defect detection model named CHC-DETR. First, the ConvNeXtv2 architecture is adopted as the backbone network, integrating GRN to optimize the model’s generalization capacity and stability. Second, a HiLo-Aware Feature Interaction module (HAFI) is designed to enhance computational efficiency and multi-scale feature extraction by separating high-frequency and low-frequency information processing. Finally, a CSP-Refined Wavelet Convolution Module (CWCM) is introduced to strengthen the encoder’s ability to extract complex defect features and leverage wavelet transform to enhance low-frequency features, improving the recognition of tiny or irregular defects. On the self-constructed CU-DET dataset, the proposed model reaches a mAP of 94.9% and an FPS of 56.8. Experimental results reveal that the proposed algorithm provides an productive and high-performance solution for industrial defect detection.
Authors
- Zihan Hu (ORCID: https://orcid.org/0009-0003-1618-9768)
- Zhiguo Fan (ORCID: https://orcid.org/0000-0001-9710-9456)
- Jun Hu (ORCID: https://orcid.org/0000-0001-6816-9417)
- Chuanlin Zhang (ORCID: https://orcid.org/0000-0002-5023-2278)
- Jinze Li (ORCID: https://orcid.org/0000-0003-2563-1223)
- Long Jin (ORCID: https://orcid.org/0000-0002-8551-1656)
Institutions
- Shanghai University of Electric Power (CN)
Publication Details
- Published
- 2025-06-20
- DOI
- https://doi.org/10.1109/isaeece66033.2025.11160252
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00