P-Band Transmission Coefficient Measurement of Small-Size Planar Transparent Materials

This article proposes a frequency-domain method based on the cross-ratio (CR) invariance principle for measuring the transmission coefficients of small-size planar transparent materials (TMs) at P-band (0.3–1 GHz). The proposed method achieves accurate measurement of materials under tests (MUTs) using three calibration standards with known transmission coefficients. This method effectively eliminates two limitations of the free-space method at P-band: insufficient temporal resolution and dependence on large-size samples. To further improve the accuracy of the proposed method, a multipoint CR method is proposed. The multipoint CR method uses additional calibration standards to construct multiple calibration triplets. Corresponding weights are assigned to each triplet based on the law of uncertainty propagation. The weighted average of the results from all triplets is then calculated to determine the final transmission coefficient of the MUT. A measurement setup is developed to verify the validity, accuracy, and repeatability of the proposed method through both simulation and measurement of three different types of materials.

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Publication Details

Journal
IEEE Transactions on Microwave Theory and Techniques
Published
2025-09-22
DOI
https://doi.org/10.1109/tmtt.2025.3610864
Primary Topic
Semiconductor Lasers and Optical Devices
Type
article
Field-Weighted Citation Impact
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article

P-Band Transmission Coefficient Measurement of Small-Size Planar Transparent Materials

Changying Wu, Yevhen Yashchyshyn, Chengqian Ma, Jianliang Zhao
IEEE Transactions on Microwave Theory and Techniques
Semiconductor Lasers and Optical Devices
article

P-Band Transmission Coefficient Measurement of Small-Size Planar Transparent Materials

Changying Wu, Yevhen Yashchyshyn, Chengqian Ma, Jianliang Zhao
article en

Abstract

This article proposes a frequency-domain method based on the cross-ratio (CR) invariance principle for measuring the transmission coefficients of small-size planar transparent materials (TMs) at P-band (0.3–1 GHz). The proposed method achieves accurate measurement of materials under tests (MUTs) using three calibration standards with known transmission coefficients. This method effectively eliminates two limitations of the free-space method at P-band: insufficient temporal resolution and dependence on large-size samples. To further improve the accuracy of the proposed method, a multipoint CR method is proposed. The multipoint CR method uses additional calibration standards to construct multiple calibration triplets. Corresponding weights are assigned to each triplet based on the law of uncertainty propagation. The weighted average of the results from all triplets is then calculated to determine the final transmission coefficient of the MUT. A measurement setup is developed to verify the validity, accuracy, and repeatability of the proposed method through both simulation and measurement of three different types of materials.

IEEE Transactions on Microwave Theory and TechniquesVol. 73(12)
Warsaw University of Technology (PL), Northwestern Polytechnical University (CN), China XD Group (China) (CN)
Openalex Percentile: Top 75%
Semiconductor Lasers and Optical Devices
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