Generation and Characterization of Vector Beams with a Single SLM for Super-Resolution Microscopy

We present a method to generate vector beams using a single spatial light modulator (SLM) for depletion-based super-resolution microscopy techniques such as STED, RESOLFT, and subtraction microscopy. We demonstrate the generation of circularly polarized Laguerre-Gaussian LG01 beams and vector beams with spatially varying polarization, such as azimuthal beams. Their intensity profiles, polarization distributions, and robustness to optical aberrations are experimentally analyzed under low-and high-numerical aperture conditions to assess their suitability for super-resolution applications.

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Publication Details

Journal
EPJ Web of Conferences
Published
2025-01-01
DOI
https://doi.org/10.1051/epjconf/202533504004
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
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article

Generation and Characterization of Vector Beams with a Single SLM for Super-Resolution Microscopy

Jordi Tiana‐Alsina, Mario Montes‐Usategui, David Maluenda, Artur Carnicer et al.
EPJ Web of Conferences
Advanced Fluorescence Microscopy Techniques
article

Generation and Characterization of Vector Beams with a Single SLM for Super-Resolution Microscopy

Jordi Tiana‐Alsina, Mario Montes‐Usategui, David Maluenda, Artur Carnicer, Estela Martı́n-Badosa, Nick Toledo-García
article en

Abstract

We present a method to generate vector beams using a single spatial light modulator (SLM) for depletion-based super-resolution microscopy techniques such as STED, RESOLFT, and subtraction microscopy. We demonstrate the generation of circularly polarized Laguerre-Gaussian LG01 beams and vector beams with spatially varying polarization, such as azimuthal beams. Their intensity profiles, polarization distributions, and robustness to optical aberrations are experimentally analyzed under low-and high-numerical aperture conditions to assess their suitability for super-resolution applications.

EPJ Web of ConferencesVol. 335
Institut de Nanociència i Nanotecnologia de la Universitat de Barcelona, Universitat de Barcelona (ES)
Openalex Percentile: Top 81%
Advanced Fluorescence Microscopy Techniques
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