Special Issue: Trends and Prospects in Applied Electromagnetics
With the rapid advancement of information technology, humans are living in an increasingly intricate electromagnetic environment [...]
Authors
- Bao‐Lin Nie (ORCID: https://orcid.org/0000-0002-9408-676X)
- Yating Yu (ORCID: https://orcid.org/0000-0001-6027-7560)
Institutions
- University of Electronic Science and Technology of China (CN)
Publication Details
- Journal
- Applied Sciences
- Published
- 2025-09-22
- DOI
- https://doi.org/10.3390/app151810279
- Primary Topic
- Non-Destructive Testing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00