A Genetic Approach for Automatic AxC Design Exploration at RTL Based on Assertion Mining and Fault Analysis

Authors

Samuele Germiniani (ORCID: https://orcid.org/0000-0003-0794-8606)
Graziano Pravadelli
Alberto Bosio (ORCID: https://orcid.org/0000-0001-6116-7339)
Marcello Traiola (ORCID: https://orcid.org/0000-0003-1484-5162)

Institutions

Université Claude Bernard Lyon 1 (FR)
University of Verona (IT)
Centre National de la Recherche Scientifique (FR)
Institut des Nanotechnologies de Lyon (FR)
Marconi University (IT)
Institut de Recherche en Informatique et Systèmes Aléatoires (FR)
Institut National des Sciences Appliquées de Lyon (FR)
Université de Rennes (FR)
École d'Ingénieurs en Chimie et Sciences du Numérique (FR)

Publication Details

Journal: IEEE Transactions on Emerging Topics in Computing
Published: 2025-09-19
DOI: https://doi.org/10.1109/tetc.2025.3609050
Primary Topic: VLSI and Analog Circuit Testing
Type: article
Field-Weighted Citation Impact: 0.00

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article

A Genetic Approach for Automatic AxC Design Exploration at RTL Based on Assertion Mining and Fault Analysis

Samuele Germiniani, Graziano Pravadelli, Alberto Bosio, Marcello Traiola

Sep 19, 2025

IEEE Transactions on Emerging Topics in Computing

VLSI and Analog Circuit Testing

article

A Genetic Approach for Automatic AxC Design Exploration at RTL Based on Assertion Mining and Fault Analysis

Samuele Germiniani, Graziano Pravadelli, Alberto Bosio, Marcello Traiola

September 19, 2025article en

Abstract

No abstract available for this paper.

IEEE Transactions on Emerging Topics in ComputingVol. 13(4)

Université Claude Bernard Lyon 1 (FR), University of Verona (IT), Centre National de la Recherche Scientifique (FR), Institut des Nanotechnologies de Lyon (FR), Marconi University (IT), Institut de Recherche en Informatique et Systèmes Aléatoires (FR), Institut National des Sciences Appliquées de Lyon (FR), Université de Rennes (FR), École d'Ingénieurs en Chimie et Sciences du Numérique (FR)

Openalex Percentile: Top 72%

VLSI and Analog Circuit Testing

DOI Open Access PDF OpenAlex

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