Nanometer-scale resolution in an ultra-high pressure environmental TEM holder

Abstract Environmental Transmission Electron Microscopy gas holders are vital for studying catalyst nanostructures in reactive gases. Although there are existing methods to understand the behavior of catalysts during reaction, a “pressure gap” exists. Pressures of up to 4.5 bar have been demonstrated, but many industrial catalysts operate at 10–100 bar. This work introduces an ultra-high-pressure TEM gas holder designed to bridge this gap. Experiments demonstrate it can safely operate and achieve nanometer-scale resolution (~ 1.5 nm) in an Environmental TEM at pressures up to 27.5 bar. Practical resolution limitations are attributed to contamination and vibration rather than increased gas scatter. Graphical abstract

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Publication Details

Journal
MRS Communications
Published
2025-09-18
DOI
https://doi.org/10.1557/s43579-025-00825-7
Citations
2
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
5.10
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article

Nanometer-scale resolution in an ultra-high pressure environmental TEM holder

Dmitri N. Zakharov, Eric A. Stach, George G. Hollyer, Calvin Parkin et al.
2 citations
MRS Communications
Advanced Electron Microscopy Techniques and Applications
5.10
article

Nanometer-scale resolution in an ultra-high pressure environmental TEM holder

Dmitri N. Zakharov, Eric A. Stach, George G. Hollyer, Calvin Parkin, Daan Hein Alsem
article en
2 citations

Abstract

Abstract Environmental Transmission Electron Microscopy gas holders are vital for studying catalyst nanostructures in reactive gases. Although there are existing methods to understand the behavior of catalysts during reaction, a “pressure gap” exists. Pressures of up to 4.5 bar have been demonstrated, but many industrial catalysts operate at 10–100 bar. This work introduces an ultra-high-pressure TEM gas holder designed to bridge this gap. Experiments demonstrate it can safely operate and achieve nanometer-scale resolution (~ 1.5 nm) in an Environmental TEM at pressures up to 27.5 bar. Practical resolution limitations are attributed to contamination and vibration rather than increased gas scatter. Graphical abstract

MRS CommunicationsVol. 15(5)
Brookhaven National Laboratory (US), Hummingbird Scientific (United States) (US), University of Pennsylvania (US)
Openalex Percentile: Top 5%
Advanced Electron Microscopy Techniques and Applications
5.10
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Nanometer-scale resolution in an ultra-high pressure environmental TEM holder — Dmitri N. Zakharov, Eric A. Stach, et al. · MRS Communications (2025) | TGRS Research Map | TGRS