COMPUTER DIFFRACTION TOMOGRAPHY. DIGITAL IMAGE PROCESSING AND ANALYSIS BASED ON THE 1D-, 2D-SIZED GUIDED AND WAVELET-FUNCTION FILTER PROCESSING

One presents and analyzes the results of computer processing for a plane-wave X-ray topography imaging of a point defect of the Coulomb-types in the Si(111) crystal recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering by using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechie's atomic function. The filtering efficiency of a topography image is determined by the parameter of the averaged over all pixels relative square deviations of the pixel intensities (RMS.) of the processed and reference (noise-free) 2D image. Practical methods for selecting filtration parameters are proposed, using which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their use for the 3D digital recovering nanosized crystal defects.