Quantum Metrology of Fluxonium Superconducting Qubits for Scalable Quantum Information Processing
Fluxonium superconducting qubits have been fabricated on sapphire substrates using an e-beam lithography-based Dolan Bridge technique. To enhance process control and improve yield, the quantum circuit fabrication is monitored through a non-destructive, in-line X-ray metrology method.
Authors
- Chia‐Hung Chen (ORCID: https://orcid.org/0000-0001-5097-3968)
- Haw-Tyng Huang (ORCID: https://orcid.org/0000-0002-9953-1623)
- Yen‐Hsiang Lin (ORCID: https://orcid.org/0000-0003-2940-428X)
- Wei‐Chen Lin (ORCID: https://orcid.org/0000-0002-8142-538X)
- Yi-Shu Lu
- M.-W. Ho
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_at.2025.jps200_85
- Primary Topic
- Quantum Computing Algorithms and Architecture
- Type
- article
- Field-Weighted Citation Impact
- 0.00