Single-shot spectroscopic ellipsometry using a metasurface array
We demonstrated a compact metasurface array-based spectroscopic ellipsometry system that allows single-shot spectropolarimetric detection and accurate determination of thin film properties without any mechanical movement.
Authors
- Yuanmu Yang (ORCID: https://orcid.org/0000-0002-5264-0822)
- Xinyuan Xue
- Shun Wen
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_at.2025.aa112_4
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00