Single-shot spectroscopic ellipsometry using a metasurface array

We demonstrated a compact metasurface array-based spectroscopic ellipsometry system that allows single-shot spectropolarimetric detection and accurate determination of thin film properties without any mechanical movement.

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Publication Details

Published
2025-01-01
DOI
https://doi.org/10.1364/cleo_at.2025.aa112_4
Primary Topic
Photonic and Optical Devices
Type
article
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article

Single-shot spectroscopic ellipsometry using a metasurface array

Yuanmu Yang, Xinyuan Xue, Shun Wen
Photonic and Optical Devices
article

Single-shot spectroscopic ellipsometry using a metasurface array

Yuanmu Yang, Xinyuan Xue, Shun Wen
article en

Abstract

We demonstrated a compact metasurface array-based spectroscopic ellipsometry system that allows single-shot spectropolarimetric detection and accurate determination of thin film properties without any mechanical movement.

Openalex Percentile: Top 75%
Photonic and Optical Devices
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Single-shot spectroscopic ellipsometry using a metasurface array — Yuanmu Yang, Xinyuan Xue, et al. · (2025) | TGRS Research Map | TGRS