Fabrication of Large Gratings Using Broad-Beam Scanning Exposure Based on Grating’s Profile Symmetry
A broad-beam scanning exposure method utilizing grating’s profile symmetry is proposed to eliminate phase-locking errors introduced by non-uniform photoresist thickness. A 200 mm × 100 mm grating with a 0.097 λ pitch error was fabricated.
Authors
- Wentao Zhan (ORCID: https://orcid.org/0000-0002-2615-7642)
- Lijiang Zeng
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_at.2025.aa112_2
- Citations
- 1
- Primary Topic
- Advanced Surface Polishing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.67