CRYSTALLOGRAPHIC CLASSIFICATION OF SPECIAL INTERCRYSTALLINE BOUNDARIES

A classification of special intercrystalline boundaries in centrosymmetric crystals of all syngonies is constructed based on the symmetric properties of planar lattices. It is shown that the set of orientation parameters identifying special boundaries is determined by the orientation of the plane formed by the matching atoms of the contacting crystals. Unlike the general type of boundaries, the number of these parameters is either two or three. It is shown that the lattice of matching bicrystal nodes appears only in crystals with high-order axes of symmetry. Possible misorientations of the contacting crystals are found depending on the symmetry of the crystallographic plane for different crystallographic conditions.

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Publication Details

Journal
Кристаллография / Crystallography Reports
Published
2025-01-01
DOI
https://doi.org/10.7868/s3034551025040037
Primary Topic
X-ray Diffraction in Crystallography
Type
article
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article

CRYSTALLOGRAPHIC CLASSIFICATION OF SPECIAL INTERCRYSTALLINE BOUNDARIES

B. M. Darinskiy
Кристаллография / Crystallography Reports
X-ray Diffraction in Crystallography
article

CRYSTALLOGRAPHIC CLASSIFICATION OF SPECIAL INTERCRYSTALLINE BOUNDARIES

B. M. Darinskiy
article en

Abstract

A classification of special intercrystalline boundaries in centrosymmetric crystals of all syngonies is constructed based on the symmetric properties of planar lattices. It is shown that the set of orientation parameters identifying special boundaries is determined by the orientation of the plane formed by the matching atoms of the contacting crystals. Unlike the general type of boundaries, the number of these parameters is either two or three. It is shown that the lattice of matching bicrystal nodes appears only in crystals with high-order axes of symmetry. Possible misorientations of the contacting crystals are found depending on the symmetry of the crystallographic plane for different crystallographic conditions.

Кристаллография / Crystallography ReportsVol. 70(4)
Openalex Percentile: Top 81%
X-ray Diffraction in Crystallography
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