The crystal structures of PdBi modifications from in-situ high-temperature single-crystal X-ray diffraction

The transformation of PdBi compound at high temperatures was studied using in-situ high-temperature single-crystal X-ray diffraction. The new data about crystal structure of high temperature PdBi modification is obtained. The structure of PdBi at T = 293, 373, 423 and 473 К, is orthorhombic, space group Cmc21, unit cell parameters: a = 8.7160(3), b = 7.2031(3), c = 10.6631(4) Å, V = 669.45(4) Å3, Z = 16 (293 К). Upon further heating, a phase transition to the high-temperature modification occurs. The structure of PdBi at T = 523 and 573 К was solved in orthorhombic space group Cmcm, a = 3.6162(3), b = 10.6446(8), c = 4.4208(4) Å, V = 170.17(3) Å3, Z = 4 (523 К).

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Publication Details

Journal
Кристаллография / Crystallography Reports
Published
2025-01-01
DOI
https://doi.org/10.7868/s3034551025030115
Primary Topic
X-ray Diffraction in Crystallography
Type
article
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article

The crystal structures of PdBi modifications from in-situ high-temperature single-crystal X-ray diffraction

O. V. Кarimova
Кристаллография / Crystallography Reports
X-ray Diffraction in Crystallography
article

The crystal structures of PdBi modifications from in-situ high-temperature single-crystal X-ray diffraction

O. V. Кarimova
article en

Abstract

The transformation of PdBi compound at high temperatures was studied using in-situ high-temperature single-crystal X-ray diffraction. The new data about crystal structure of high temperature PdBi modification is obtained. The structure of PdBi at T = 293, 373, 423 and 473 К, is orthorhombic, space group Cmc21, unit cell parameters: a = 8.7160(3), b = 7.2031(3), c = 10.6631(4) Å, V = 669.45(4) Å3, Z = 16 (293 К). Upon further heating, a phase transition to the high-temperature modification occurs. The structure of PdBi at T = 523 and 573 К was solved in orthorhombic space group Cmcm, a = 3.6162(3), b = 10.6446(8), c = 4.4208(4) Å, V = 170.17(3) Å3, Z = 4 (523 К).

Кристаллография / Crystallography ReportsVol. 70(3)
Openalex Percentile: Top 81%
X-ray Diffraction in Crystallography
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