Investigation of the effect of scattering mechanisms on the excess noise behavior in Sb-based avalanche photodiodes using Monte Carlo simulation
The proposed Monte Carlo model reveals the effect of alloy scattering on the excess noise factor (F(M)) in Al 0.7 InAsSb avalanche photodiodes. A comparison between the F(M) of different combinations of scattering rates is investigated.
Authors
- J. Andrew McArthur (ORCID: https://orcid.org/0000-0003-0424-7695)
- Seth R. Bank (ORCID: https://orcid.org/0000-0002-5682-0126)
- Daniel J. Herrera (ORCID: https://orcid.org/0000-0001-8878-3297)
- Dongxia Wei (ORCID: https://orcid.org/0000-0002-4653-2497)
- Joe C. Campbell (ORCID: https://orcid.org/0000-0001-6812-7647)
- Adam A. Dadey (ORCID: https://orcid.org/0000-0002-1018-3651)
- H. Karimi (ORCID: https://orcid.org/0000-0001-8044-1284)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_at.2025.jps100_128
- Primary Topic
- Advanced Optical Sensing Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00