Terahertz Conductivity of Gadolinium Thin Films Deposited on Sapphire Substrate
Two gadolinium films with thicknesses of 23 nm and 67 nm were analyzed using THz time-domain spectroscopy. The resulting sheet conductivity was fit with a Drude-Smith model, resulting in relaxation times of 100 fs and 90 fs respectively.
Authors
- S. P. Wong (ORCID: https://orcid.org/0009-0004-2711-7679)
- I.N. Demchenko (ORCID: https://orcid.org/0000-0003-3680-1072)
- R. Minikayev (ORCID: https://orcid.org/0000-0002-4334-7472)
- Christian Steiner
- Bruno Cury Camargo (ORCID: https://orcid.org/0000-0002-5172-846X)
- I. Komissarov (ORCID: https://orcid.org/0000-0002-0587-7122)
- Roman Sobolewski (ORCID: https://orcid.org/0000-0003-0868-0779)
- Chris Smith (ORCID: https://orcid.org/0000-0002-1348-189X)
- Jacob Weingard
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_at.2025.jps100_175
- Primary Topic
- Semiconductor materials and interfaces
- Type
- article
- Field-Weighted Citation Impact
- 0.00