Research on DC-Drift of TFLN modulator
To delve into the DC-drift phenomenon of the Thin-Film Lithium Niobate (TFLN) modulator, we have comprehensively applied theoretical analysis, experimental research, and numerical simulation methods. The generation mechanism, influencing factors, and suppression strategies of DC-drift are systematically investigated. The experimental results show that optimizing the material properties, structural design, and adopting appropriate circuit control techniques can effectively suppress the DC-drift of the TFLN modulator, providing a theoretical and practical basis for improving the performance and stability of TFLN-based optical devices.
Authors
- Jinbiao Xiao (ORCID: https://orcid.org/0000-0002-8937-3879)
- Lan Peng (ORCID: https://orcid.org/0000-0002-2426-8365)
- 关宝 赵
Institutions
- Western Laboratories (United States) (US)
Publication Details
- Published
- 2025-09-18
- DOI
- https://doi.org/10.1117/12.3087753
- Primary Topic
- Semiconductor Lasers and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00