Room-temperature deposition of large-area dielectric thin films via vacuum ultraviolet (VUV) photo-processes synthesis
The fabrication of oxide thin films typically requires high temperatures exceeding 900 °C and thermal equilibrium conditions, which pose significant challenges for thermal budget management. To address these limitations, this study demonstrates that a 172 nm vacuum ultraviolet (VUV) microplasma flat lamp can enable the room-temperature synthesis of SiO<sub>2</sub> using tetraethoxysilane (TEOS) as a precursor. The high-energy VUV photons facilitate a direct liquid-to-solid photochemical transformation, eliminating the need for elevated temperatures. Building on this success, the roomtemperature synthesis of Al<sub>2</sub>O<sub>3</sub> thin films was also investigated. The feasibility of VUV-assisted Al<sub>2</sub>O<sub>3</sub> thin layer deposition was confirmed by its characterization and further development of the photo-processes will be discussed in detail.
Authors
- Jingyang Kong
- Dane J. Sievers (ORCID: https://orcid.org/0000-0003-0996-0238)
- J. G. Eden (ORCID: https://orcid.org/0000-0002-3470-9793)
- Andrey E. Mironov (ORCID: https://orcid.org/0000-0003-4974-8530)
- Sung‐Jin Park (ORCID: https://orcid.org/0000-0002-9260-0091)
- Jin‐Hong Kim (ORCID: https://orcid.org/0000-0002-6480-1929)
Institutions
- Intel (United States) (US)
- University of Illinois System (US)
Publication Details
- Published
- 2025-09-18
- DOI
- https://doi.org/10.1117/12.3065338
- Primary Topic
- Optical Coatings and Gratings
- Type
- article
- Field-Weighted Citation Impact
- 0.00