Stabilization of x-ray beam for nanoimaging using source electron fast orbit feedback
X-ray beam stability is critical for achieving higher spatial resolution and sensitivity in nanoimaging. At the Hard X-ray Nanoprobe (HXN) beamline at Brookhaven National Laboratory (BNL), we analyzed x-ray beam vibrations and identified dominant peaks at 27Hz and 120Hz, which could affect imaging quality. While local mechanical feedback helps reduce beam vibrations, its bandwidth is limited and does not effectively suppress these peaks. Since the electron beam in the storage ring can affect the x-ray beam position as well, we explored the idea of using electron orbit feedback to suppress x-ray beam vibrations, which operates at a much higher bandwidth. To facilitate this, we developed a data transfer system that integrates beamline diagnostics with accelerator feedback. Our results show significant vibration reduction measured by a diamond beam position monitor and a camera. This work demonstrates the potential of electron orbit feedback in stabilizing the x-ray beam for nanoimaging applications.
Authors
- Guimei Wang (ORCID: https://orcid.org/0000-0002-6890-0406)
- Sukho Kongtawong (ORCID: https://orcid.org/0000-0002-5668-6596)
- Timur Shaftan (ORCID: https://orcid.org/0000-0002-9066-6150)
- Yong S. Chu (ORCID: https://orcid.org/0000-0002-8624-5329)
- D. Padrazo
- Hanfei Yan (ORCID: https://orcid.org/0000-0001-6824-0367)
- J. Mead
- Tian Yuke
- Kiman Ha
Institutions
- Brookhaven National Laboratory (US)
- Synchrotron Light Research Institute (TH)
Publication Details
- Published
- 2025-09-18
- DOI
- https://doi.org/10.1117/12.3063377
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00