CNN-enhanced nanostructure characterization via combined x-ray ptychography and SAXS imaging (pty-co-SAXS)

Multi-length scale structure characterization is essential for hierarchical samples, as morphology and nanostructure arrangements influence material properties. X-ray techniques like SAXS reveal internal structures but provide ensemble-averaged data, limiting insight into local arrangements. X-ray ptychography offers high-resolution probing of both surface and internal structures, making it ideal to combine with SAXS. This combined pty-co-SAXS approach enables nanoscale morphology imaging alongside SAXS-based nanostructure information. APS upgrades at Argonne will enhance coherent flux and beam brightness, boosting imaging performance and SAXS sensitivity. Our proposed method correlates both techniques efficiently, using a single detector while minimizing radiation exposure