Development of tender x-ray spectroscopic ptychography system using advanced Kirkpatrick-Baez focusing mirrors

Tender x-ray ptychography is a high-spatial-resolution imaging technique that enables the observation of microstructures and chemical states. We developed a high-efficiency ptychography measurement system equipped with advanced Kirkpatrick–Baez focusing mirrors at the BL10U beamline of NanoTerasu, the new 3 GeV synchrotron radiation facility in Japan. By using this system, we successfully obtained the images of a SnO₂ particle near the Sn L₃- edge with a spatial resolution better than 56.6nm. The absorption spectra extracted from the reconstructed images clearly exhibited the edge structure. This advancement provides an important foundation for nanoscale observation of chemical states inside energy devices and biological samples, as well as for three-dimensional imaging of such samples. We hope that this technique will contribute to the advancement of fields that require nanoscale observation.