Development of long working distance reflection optics for soft x-ray reflection ptychography

Soft x-ray microscopy is increasingly applied in fields such as biology and solid-state physics. Among soft x-ray imaging techniques, ptychography is a method that retrieves phase information from coherent diffraction patterns with iterative calculations. Ptychography enables high spatial resolution and field of view independent of the optical setup. However, conventional soft x-ray ptychography experiments require the sample to be thin to ensure sufficient transmission. To overcome this limitation, we propose a new reflective optical setup for x-ray ptychography, where the sample is tilted significantly to reflect soft x-rays from its surface. This configuration allows for the analysis of thick and opaque samples, greatly expanding the range of materials and conditions that can be investigated. Furthermore, it will enable surface imaging, which is difficult for the standard transmission geometry.