Deep Sensing for Retrieving Optical Thickness
We present a novel method for deep sensing using pseudo-random encoded signals by a silicon photonic spectral sampler. We demonstrate such a compact sensor for retrieving optical thickness, holding great potential for miniaturized thickness gauge.
Authors
- Richard V. Penty (ORCID: https://orcid.org/0000-0003-4605-1455)
- Zhitian Shi (ORCID: https://orcid.org/0000-0003-0539-219X)
- Qixiang Cheng (ORCID: https://orcid.org/0000-0001-8671-2102)
- Huiyu Huang (ORCID: https://orcid.org/0000-0003-2892-2712)
- A. Wonfor (ORCID: https://orcid.org/0000-0003-2219-7900)
- Wanlu Zhang (ORCID: https://orcid.org/0000-0002-7119-1874)
- Ming Liang (ORCID: https://orcid.org/0000-0002-9990-838X)
- Yizhi Wang (ORCID: https://orcid.org/0000-0002-9232-7523)
- Ziyao Zhang (ORCID: https://orcid.org/0000-0002-0617-1340)
- Ting Yan (ORCID: https://orcid.org/0000-0001-9830-6646)
- Chunhui Yao (ORCID: https://orcid.org/0000-0002-8524-0833)
- Yuxiao Ye
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_at.2025.jps200_35
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.00