Unveiling Light Within Photonic Integrated Circuits by Nonlinear Near-field Optical Microscopy
We present a method to visualize light propagation in photonic circuits using silicon’s nonlinear properties, which allows real-time, non-invasive electric field mapping and parameter extraction in integrated devices without disrupting their operation.
Authors
- Shai Tsesses (ORCID: https://orcid.org/0000-0003-0167-3402)
- Amir Rosenthal (ORCID: https://orcid.org/0000-0001-8077-7773)
- Guy Bartal (ORCID: https://orcid.org/0000-0002-0554-4192)
- Kobi Cohen (ORCID: https://orcid.org/0000-0002-0707-8885)
- Yoav Hazan (ORCID: https://orcid.org/0000-0003-4503-6990)
- Matan Iluz (ORCID: https://orcid.org/0009-0008-5752-3407)
- Jacob Kheireddine
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_fs.2025.ff147_8
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00