Structural origin of the light-induced spectral gap suppression in Ta2NiSe5
Using MeV ultrafast electron diffraction to map out atomic trajectories, we revealed that reduced monoclinic distortion primarily explains the photoinduced gap suppression in the electronic structure of Ta 2 NiSe 5 , a leading excitonic insulator candidate.
Authors
- Qing Xu (ORCID: https://orcid.org/0000-0001-5063-6240)
- Jun Li (ORCID: https://orcid.org/0000-0003-1180-5798)
- Nanlin Wang (ORCID: https://orcid.org/0000-0003-2584-9265)
- Pengfei Zhu (ORCID: https://orcid.org/0000-0001-7328-4161)
- Qiaomei Liu (ORCID: https://orcid.org/0000-0002-1564-5683)
- Chenhang Xu (ORCID: https://orcid.org/0000-0003-1610-3568)
- Dao Xiang (ORCID: https://orcid.org/0000-0003-1590-7193)
- Xiao Zou (ORCID: https://orcid.org/0000-0002-9833-8493)
- Dong Wu (ORCID: https://orcid.org/0000-0002-4353-4518)
- Weichen Tang (ORCID: https://orcid.org/0000-0002-1945-5369)
- Dong Qian (ORCID: https://orcid.org/0000-0001-5891-8138)
- Alfred Zong (ORCID: https://orcid.org/0000-0003-2047-3801)
- Chendi Xie (ORCID: https://orcid.org/0000-0001-8938-2276)
- Zhiwei Wang (ORCID: https://orcid.org/0000-0003-0182-2471)
- Tao Jiang (ORCID: https://orcid.org/0000-0003-1594-4111)
- Zijing Chen (ORCID: https://orcid.org/0000-0002-9637-2217)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_fs.2025.ff135_2
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00