Thickness tailorability of ENZ-enhanced third-harmonic generation in aluminum-doped zinc oxide
We show thickness-tailored epsilon-near-zero enhancement of third harmonic generation in aluminum-doped zinc oxide. We find that the ENZ crossover wavelength increases with the film thickness, contrasting with prior results for thinner films and suggesting a limit on the minimum ENZ wavelength achievable via thickness tailoring.
Authors
- Richard D. Schaller (ORCID: https://orcid.org/0000-0001-9696-8830)
- Vahagn K. Mkhitaryan (ORCID: https://orcid.org/0000-0002-3138-8488)
- Soham Saha
- Colton Fruhling (ORCID: https://orcid.org/0000-0002-8296-8802)
- Mustafa Goksu Ozlu
- Kyu Ri Choi
- Miroslava Marinova
- Vladimir M. Shalaev
- Alexandra Boltasseva
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cleo_fs.2025.ff143_1
- Primary Topic
- Photorefractive and Nonlinear Optics
- Type
- article
- Field-Weighted Citation Impact
- 0.00