Intensity enhancement of free-electron X-ray radiation in bulk van der Waals materials

We experimentally measure free-electron-driven tunable X-rays from bulk van der Waals crystals, breaking the notion that these signatures are observable only from thin films, and showing that intensity enhancements of up to tenfold are possible.

Authors

Liang Jie Wong (ORCID: https://orcid.org/0000-0002-9601-9456)
Ruihuan Duan (ORCID: https://orcid.org/0000-0003-4999-9735)
Sunchao Huang (ORCID: https://orcid.org/0000-0003-3456-1116)
Nikhil Pramanik
Zheng Liu
Qingwei Zhai

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.1364/cleo_fs.2025.ff121_2
Primary Topic: Topological Materials and Phenomena
Type: article
Field-Weighted Citation Impact: 0.00

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article

Intensity enhancement of free-electron X-ray radiation in bulk van der Waals materials

Liang Jie Wong, Ruihuan Duan, Sunchao Huang, Nikhil Pramanik et al.

Jan 1, 2025

Topological Materials and Phenomena

article

Intensity enhancement of free-electron X-ray radiation in bulk van der Waals materials

Liang Jie Wong, Ruihuan Duan, Sunchao Huang, Nikhil Pramanik, Zheng Liu, Qingwei Zhai

January 1, 2025article en

Abstract

Openalex Percentile: Top 80%

Topological Materials and Phenomena

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Intensity enhancement of free-electron X-ray radiation in bulk van der Waals materials — Liang Jie Wong, Ruihuan Duan, et al. · (2025) | TGRS Research Map | TGRS