Enhancing deep-learning-based structured illumination microscopy reconstruction with light field awareness
Structured illumination microscopy (SIM) is a pivotal technique for dynamic subcellular imaging in live cells.Conventional SIM reconstruction algorithms depend on accurately estimating the illumination pattern and can introduce artifacts when this estimation is imprecise.Although recent deep-learning-based SIM reconstruction methods have improved speed, accuracy, and robustness, they often struggle with out-of-distribution data.To address this limitation, we propose an awareness-of-light-field SIM (AL-SIM) reconstruction approach that directly estimates the actual light field to correct for errors arising from data distribution shifts.Through comprehensive experiments on both simulated filament structures and live BSC1 cells, our method demonstrates a 7% reduction in the normalized root mean square error (NRMSE) and substantially lowers reconstruction artifacts.By minimizing these artifacts and improving overall accuracy, AL-SIM broadens the applicability of SIM for complex biological systems.
Authors
- Long‐Kun Shan
- Fang‐Wen Sun (ORCID: https://orcid.org/0000-0002-9625-7390)
- Tong-Tian Weng
- Zehao Wang (ORCID: https://orcid.org/0000-0002-9513-6714)
- Xiangdong Chen
Institutions
- University of Science and Technology of China (CN)
Publication Details
- Journal
- Chinese Optics Letters
- Published
- 2025-01-01
- DOI
- https://doi.org/10.3788/col202523.101101
- Primary Topic
- Advanced Fluorescence Microscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- University of Science and Technology of China
- Anhui Provincial Key Research and Development Plan