Internal silicon laser processing with picosecond double pulses
Nonlinear propagation effects present major challenges for inscription inside silicon using ultrashort laser pulses. To overcome these limitations, we employ single-digit picosecond double pulses with picosecond pulse-to-pulse delays, enabling repeatable in-volume modifications. The double-pulse benefits are most pronounced for temporally separated pulses with perpendicular polarization. In contrast, interference caused by temporally overlapping pulses with parallel polarization has a catastrophic impact on in-volume modification. Both energy deposition efficiency and modification size are controlled by adjusting the energy balance between the two pulses and the total energy. Double-pulse irradiation offers a promising approach for precise internal functionalization of silicon.
Authors
- Maxime Chambonneau (ORCID: https://orcid.org/0000-0003-1910-2296)
- Stefan Nolte (ORCID: https://orcid.org/0000-0002-2919-2662)
- Markus Blothe (ORCID: https://orcid.org/0000-0002-0890-2186)
- J. Joseph (ORCID: https://orcid.org/0009-0001-7996-6136)
Institutions
- Friedrich Schiller University Jena (DE)
Publication Details
- Journal
- Optics Letters
- Published
- 2025-09-17
- DOI
- https://doi.org/10.1364/ol.575250
- Primary Topic
- Laser Material Processing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00