Wafer-scale correlated morphology and optoelectronic properties in GaAs/AlGaAs core-shell nanowires
We investigate wafer-scale correlations between morphology and optoelectronic properties in GaAs/AlGaAs nanowires. Despite structural inhomogeneities, carrier lifetime remains stable, highlighting uniform material quality and potential for scalable III-V semiconductor integration in photonic and optoelectronic applications.
Authors
- Patrick Parkinson (ORCID: https://orcid.org/0000-0001-9429-9768)
- Stephen Church (ORCID: https://orcid.org/0000-0002-0413-7050)
- Keisuke Minehisa (ORCID: https://orcid.org/0009-0001-0644-4433)
- Fumitaro Ishikawa (ORCID: https://orcid.org/0000-0002-5632-056X)
- Ipsita Das (ORCID: https://orcid.org/0009-0007-9368-0808)
Institutions
- Hokkaido University (JP)
- University of Manchester (GB)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/solith.2025.sw4d.6
- Primary Topic
- Nanowire Synthesis and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00