Achieving optical accuracy in sampled surfaces
Converting aspheric and freeform surfaces into an optical software format requires sampling with an optimal interpolation technique and resolution. The conversion resolution is crucial for maintaining optical accuracy. Oversampling generates excessive data, while insufficient resolution can introduce fit errors, leading to unintended stray light, ghosting artifacts, power loss, and efficiency degradation. This study examines various sampled surfaces with different shapes and surface irregularities to investigate the necessary resolutions for achieving optical accuracy while preserving critical surface features. Fit accuracy is evaluated under different sampling resolutions and interpolation methods. Our work aims to improve the handling of Grid, CAD, and True Freeform sampled surfaces within optical design workflows.
Authors
- David Vega (ORCID: https://orcid.org/0000-0001-9053-8223)
- Laleh Mokhtarpour
- Erin Elliot
- Shawn Gay
Institutions
- Ansys (United States) (US)
- Ansys (Canada) (CA)
Publication Details
- Published
- 2025-09-16
- DOI
- https://doi.org/10.1117/12.3065145
- Primary Topic
- Surface Roughness and Optical Measurements
- Type
- article
- Field-Weighted Citation Impact
- 0.00