Single-Phase Ground Fault Detection Method in Three-Phase Four-Wire Distribution Systems Using Optuna-Optimized TabNet

Single-phase ground (SPG) faults pose significant challenges in three-phase four-wire distribution systems due to their complex transient characteristics and the presence of multiple influencing factors. To solve the aforementioned issues, a comprehensive fault identification framework is proposed, which uses the TabNet deep learning architecture with hyperparameters optimized by Optuna. Firstly, a 10 kV simulation model is developed in Simulink to generate a diverse fault dataset. For each simulated fault, voltage and current signals from eight channels (L1–L4 voltage and current) are collected. Secondly, multi-domain features are extracted from each channel across time, frequency, waveform, and wavelet perspectives. Then, an attention-based fusion mechanism is employed to capture cross-channel dependencies, followed by L2-norm-based feature selection to enhance generalization. Finally, the optimized TabNet model effectively classifies 24 fault categories, achieving an accuracy of 97.33%, and outperforms baseline methods including Temporal Convolutional Network (TCN), Convolutional Neural Network-Long Short-Term Memory (CNN-LSTM), Capsule Network with Sparse Filtering (CNSF), and Dual-Branch CNN in terms of accuracy, macro-F1 score, and kappa coefficient. It also exhibits strong stability and fast convergence during training. These results demonstrate the robustness and interpretability of the proposed method for SPG fault detection.

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Publication Details

Journal
Electronics
Published
2025-09-16
DOI
https://doi.org/10.3390/electronics14183659
Primary Topic
Power Systems Fault Detection
Type
article
Field-Weighted Citation Impact
0.00

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article

Single-Phase Ground Fault Detection Method in Three-Phase Four-Wire Distribution Systems Using Optuna-Optimized TabNet

Vivienne Hui Fan, Xiaoyuan Wei, Xiaohua Wan, Min Li
Electronics
Power Systems Fault Detection
article

Single-Phase Ground Fault Detection Method in Three-Phase Four-Wire Distribution Systems Using Optuna-Optimized TabNet

Vivienne Hui Fan, Xiaoyuan Wei, Xiaohua Wan, Min Li
article en

Abstract

Single-phase ground (SPG) faults pose significant challenges in three-phase four-wire distribution systems due to their complex transient characteristics and the presence of multiple influencing factors. To solve the aforementioned issues, a comprehensive fault identification framework is proposed, which uses the TabNet deep learning architecture with hyperparameters optimized by Optuna. Firstly, a 10 kV simulation model is developed in Simulink to generate a diverse fault dataset. For each simulated fault, voltage and current signals from eight channels (L1–L4 voltage and current) are collected. Secondly, multi-domain features are extracted from each channel across time, frequency, waveform, and wavelet perspectives. Then, an attention-based fusion mechanism is employed to capture cross-channel dependencies, followed by L2-norm-based feature selection to enhance generalization. Finally, the optimized TabNet model effectively classifies 24 fault categories, achieving an accuracy of 97.33%, and outperforms baseline methods including Temporal Convolutional Network (TCN), Convolutional Neural Network-Long Short-Term Memory (CNN-LSTM), Capsule Network with Sparse Filtering (CNSF), and Dual-Branch CNN in terms of accuracy, macro-F1 score, and kappa coefficient. It also exhibits strong stability and fast convergence during training. These results demonstrate the robustness and interpretability of the proposed method for SPG fault detection.

ElectronicsVol. 14(18)
Lanzhou University of Technology (CN), State Power Investment Corporation (China) (CN), PowerChina (China) (CN), Economic Research Institute (BG)
National Natural Science Foundation of China
Openalex Percentile: Top 69%
Power Systems Fault Detection
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Single-Phase Ground Fault Detection Method in Three-Phase Four-Wire Distribution Systems Using Optuna-Optimized TabNet — Vivienne Hui Fan, Xiaoyuan Wei, et al. · Electronics (2025) | TGRS Research Map | TGRS