Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison

Daily, thousands of laptops pass through repair centers of electronic device manufacturers. During visual inspections, technicians manually identify potential cosmetic or structural damage, documenting findings with photos or videos. This process safeguards the repair center against claims related to damage incurred in custody. However, the manual approach is time-consuming and prone to human error. To address this, we propose a computer vision model to automatically detect appearance defects in laptops. Experiments were conducted using five deep neural networks: Mask R-CNN, SSD, Swin Transformer, YOLOv5, and YOLOv10. Our best-performing model achieved a mean Average Precision (mAP) of 70.2%, showcasing the viability of such application.

Authors

Institutions

Publication Details

Published
2025-07-20
DOI
https://doi.org/10.5753/semish.2025.7056
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison

Joaquim Bento Cavalcante Neto, J. Santiago, Lucas Sena, Javam C. Machado et al.
Industrial Vision Systems and Defect Detection
article

Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison

Joaquim Bento Cavalcante Neto, J. Santiago, Lucas Sena, Javam C. Machado, Lucas Cabral, Yuri Lenon
article en

Abstract

Daily, thousands of laptops pass through repair centers of electronic device manufacturers. During visual inspections, technicians manually identify potential cosmetic or structural damage, documenting findings with photos or videos. This process safeguards the repair center against claims related to damage incurred in custody. However, the manual approach is time-consuming and prone to human error. To address this, we propose a computer vision model to automatically detect appearance defects in laptops. Experiments were conducted using five deep neural networks: Mask R-CNN, SSD, Swin Transformer, YOLOv5, and YOLOv10. Our best-performing model achieved a mean Average Precision (mAP) of 70.2%, showcasing the viability of such application.

United Food and Commercial Workers (US)
Openalex Percentile: Top 65%
Industrial Vision Systems and Defect Detection
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Deep Learning for Appearance Defect Inspection in Laptops: A Model Comparison — Joaquim Bento Cavalcante Neto, J. Santiago, et al. · (2025) | TGRS Research Map | TGRS