Refined sub-region nanoindentation and FEM modeling of solvent-modified sintered silver joints for enhanced reliability prediction in power electronics
• Sub-region modeling strategy for porous pressureless sintered silver joints were proposed. • Solvent modulation through epoxy enhanced the shear strength for 2.2 times compared with no epoxy samples. • Sub-region tests revealed localized mechanical gradients in sintered joints, showing epoxy's role in modulating properties. • Region-specific FEM simulations predicted thermal stress accurately and matched 500-cycle TCT reliability observations. The mechanical reliability of sintered silver joints, widely used in power electronics packaging, is critical for long-term applications such as electric vehicle converters. However, conventional homogeneous modeling often oversimplifies internal microstructural variations and limits the accuracy of stress prediction, especially under thermal cycling. In this study, a region-refined modeling framework is proposed to account for epoxy-regulated porosity and mechanical inhomogeneity across the joint. Pressureless die-attach joints were prepared using submicron silver pastes with varying epoxy contents (0∼4 wt%). The joint was divided into five sub-regions from the center to the fillet for localized characterization. Nanoindentation, SEM, and EDS analyses were conducted to assess region-specific mechanical properties and microstructure. Power-law constitutive models were extracted for each region and implemented into finite element simulations of thermal cycling (−55 ∼ 150 °C, 2 cycles/h, 250 h). The sub-region FEM model more accurately captured local stress concentrations and identified failure-prone areas, particularly near the fillet, compared to conventional homogeneous models. Experimental validation confirmed a good correlation between simulated stress zones and observed degradation. This sub-region strategy provides a robust framework for reliability prediction and design optimization of sintered silver joints in high-performance, large-area packaging applications.
Authors
- Guoqi Zhang (ORCID: https://orcid.org/0000-0002-8023-5170)
- Lifang Bian (ORCID: https://orcid.org/0000-0001-5479-7092)
- Wenting Liu (ORCID: https://orcid.org/0000-0002-1217-9875)
- Zhoudong Yang
- Haixue Chen
- Jing Zhang (ORCID: https://orcid.org/0000-0002-0734-3263)
- Xinyue Wang (ORCID: https://orcid.org/0000-0002-0863-8709)
- Pan Liu (ORCID: https://orcid.org/0009-0008-2028-3147)
- Yi‐Ping Sun
Institutions
- Ningbo University (CN)
- Fudan University (CN)
- Delft University of Technology (NL)
Publication Details
- Journal
- Materials & Design
- Published
- 2025-09-09
- DOI
- https://doi.org/10.1016/j.matdes.2025.114716
- Citations
- 1
- Primary Topic
- Electronic Packaging and Soldering Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73