Optimizing the Reliability of Bi<sub>2</sub>Te<sub>3</sub>-Based Thermoelectric Generators with Asymmetric Structures under Large Temperature Difference

The thermoelectric (TE) recovery technology for industrial waste heat is crucial for improving energy utilization efficiency. Currently, commercial Bi2Te3-based thermoelectric generators (TEGs) show significant reliability issues when operating under large temperature differences (Th > 200 °C, ΔT > 150 °C). This is primarily due to the accumulation of interfacial thermal stress resulting from traditional rigid structural designs and material degradation at high temperatures. In this work, we improve two TEG structures: B-TEG (symmetrically modified with thermal conductive adhesive) and C-TEG (asymmetric design using arc-sprayed Zn/Al electrodes). Finite element simulations indicate that under thermal shock (from 100 °C to 250 °C), B-TEG can reduce interfacial stress by 78% compared to traditional rigidly bonded TEGs (A-TEG). Excellent stability was confirmed through 2000 thermal cycles and 1000 h of aging tests. The AC resistance (ACR) change rate of C-TEG is only 0.90%, outperforming B-TEG (1.28%) and A-TEG (which experienced 100% failure). Microstructural analysis (SEM/TEM) confirms that the arc-sprayed Ni layer forms an active NiBi3 phase at the interface, effectively suppressing crack propagation and interelement diffusion. The asymmetric design of C-TEG, combined with scalable arc spraying manufacturing, provides a robust solution for enhancing TEG reliability in extreme thermal environments.

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Publication Details

Journal
ACS Applied Electronic Materials
Published
2025-09-15
DOI
https://doi.org/10.1021/acsaelm.5c01475
Primary Topic
Advanced Thermoelectric Materials and Devices
Type
article
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article

Optimizing the Reliability of Bi2Te3-Based Thermoelectric Generators with Asymmetric Structures under Large Temperature Difference

Bachir Melzi, Weiqiang Cao, Xinfeng Tang, Jianan Lyu et al.
ACS Applied Electronic Materials
Advanced Thermoelectric Materials and Devices
article

Optimizing the Reliability of Bi2Te3-Based Thermoelectric Generators with Asymmetric Structures under Large Temperature Difference

Bachir Melzi, Weiqiang Cao, Xinfeng Tang, Jianan Lyu, Dongwang Yang, Yonggao Yan, Ziao Wang
article en

Abstract

The thermoelectric (TE) recovery technology for industrial waste heat is crucial for improving energy utilization efficiency. Currently, commercial Bi2Te3-based thermoelectric generators (TEGs) show significant reliability issues when operating under large temperature differences (Th > 200 °C, ΔT > 150 °C). This is primarily due to the accumulation of interfacial thermal stress resulting from traditional rigid structural designs and material degradation at high temperatures. In this work, we improve two TEG structures: B-TEG (symmetrically modified with thermal conductive adhesive) and C-TEG (asymmetric design using arc-sprayed Zn/Al electrodes). Finite element simulations indicate that under thermal shock (from 100 °C to 250 °C), B-TEG can reduce interfacial stress by 78% compared to traditional rigidly bonded TEGs (A-TEG). Excellent stability was confirmed through 2000 thermal cycles and 1000 h of aging tests. The AC resistance (ACR) change rate of C-TEG is only 0.90%, outperforming B-TEG (1.28%) and A-TEG (which experienced 100% failure). Microstructural analysis (SEM/TEM) confirms that the arc-sprayed Ni layer forms an active NiBi3 phase at the interface, effectively suppressing crack propagation and interelement diffusion. The asymmetric design of C-TEG, combined with scalable arc spraying manufacturing, provides a robust solution for enhancing TEG reliability in extreme thermal environments.

ACS Applied Electronic MaterialsVol. 7(18)
Wuhan University of Technology (CN), State Key Laboratory of Advanced Technology For Materials Synthesis and Processing
Openalex Percentile: Top 81%
Advanced Thermoelectric Materials and Devices
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Optimizing the Reliability of Bi<sub>2</sub>Te<sub>3</sub>-Based Thermoelectric Generators with Asymmetric Structures under Large Temperature Difference — Bachir Melzi, Weiqiang Cao, et al. · ACS Applied Electronic Materials (2025) | TGRS Research Map | TGRS